Electron microscope vibration is an increasing concern in modern laboratories because of improving resolution and extended duration imaging. At higher resolution, external vibrations have a proportionally greater impact on image quality. Also, extended duration imaging and 3D reconstructions cause image quality to be more susceptible to incremental sources of vibration. Owners need to bear this […]
read moreActive vs. passive vibration isolation, understanding the difference is critical to mitigating the impacts of vibration on equipment performance. Passive isolation systems use the natural properties of a spring and a dampener to reduce vibration. Active vibration isolation systems use a control system with integrated sensors and actuators, improving low-frequency performance. Engineers use vibration isolation […]
read moreAn EMI cancellation system cancels electromagnetic interference (EMI) that degrades electron microscopes performance. Using a sensor, controller, and field canceling loops, the EMI cancellation system measures the ambient magnetic field at the electron beam column and then generates an equal and opposite field thereby eliminates EMI that would otherwise cause interference on the image. The […]
read moreDC and AC magnetic fields create electromagnetic interference (EMI) that can degrade the performance of electron microscopes and e-beam lithography tools. Although AC and DC magnetic fields are related, each impacts equipment differently. There are different strategies to mitigate both, but an AC+DC active magnetic field cancelation system is often the simplest and most cost-effective […]
read moreLow-frequency and high-frequency vibration both have a significant impact on electron microscopy laboratories and high-tech manufacturing facilities. These two types of vibration stem from different causes and the strategy for mitigating vibration for each is also different. Vibration Engineering Consultants (VEC) can help you quantify and identify the vibration in your facility and work with […]
read moreWhen purchasing or moving a new electron microscope or process tool, customers have a few options when it comes to deciding who should provide their site survey. The original equipment manufacturer (OEM) will often offer the survey, and organizations sometimes attempt to conduct the survey themselves in-house. In this post, we will discuss the benefits […]
read moreOverview: Changes in DC magnetic field levels near an electron microscope or e-beam lithography tool degrade image quality and inhibit production. A change in DC fields often results in image distortion, a blurred image, or image drift. Common sources of change in DC magnetic fields are variation in the Earth’s magnetic field and the movement […]
read moreLet VEC help you make informed decisions and protect against unwanted surprises A site survey for an electron microscope, analytical equipment, or a sensitive manufacturing tool is a critical requirement whenever purchasing a piece of equipment or moving into a new laboratory or cleanroom. Site surveys both help determine if your space meets manufacturer specifications […]
read moreDiscussion: Reducing Vibration from Mechanical Equipment in an Electron Microscopy Lab: Laboratories often have vibrating equipment that causes disturbances on electron microscope images. These sources include chillers, vacuum pumps, transformers, etc.. At VEC, this is a problem that we commonly see in our clients’ laboratories. Following some basic guidelines can help reduce the impact of […]
read more