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Why Use a Third-Party for Your Site Survey

July 16, 2019

A new microscope and semiconductor customers have a few options when it comes to deciding who should provide their site survey. The original equipment manufacturer (OEM) will often offer the survey; organizations sometimes attempt to conduct the surveys themselves in-house. In this post, we explain why a third-party site survey provides considerable benefits and is […]

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DC Field Disturbances on Electron Microscopes and E-Beam Lithography Tools

January 24, 2018

Overview: Changes in DC magnetic field levels near an electron microscope or e-beam lithography tool degrade image quality and inhibit production. A change in DC fields often results in image distortion, a blurred image, or image drift. Common sources of change in DC fields are variation in the Earth’s magnetic field and the movement of […]

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Why a Site Survey is Import

November 21, 2017

Let VEC help you make informed decisions and protect against unwanted surprises Overview: Site surveys are a critical requirement whenever purchasing new tools or moving into a new laboratory or clean room. Site surveys both help determine if your space meets manufacturer specifications and if additional preparatory work is required. This could be the replacement […]

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Reducing Vibration from Mechanical Equipment in an Electron Microscopy Lab

November 21, 2017

Discussion: Reducing Vibration from Mechanical Equipment in an Electron Microscopy Lab: Laboratories often have vibrating equipment that causes disturbances on electron microscope images.  These sources include chillers, vacuum pumps, transformers, etc..  At VEC, this is a problem that we commonly see in our clients’ laboratories.  Following some basic guidelines can help reduce the impact of […]

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vibration reduction for sensitive instruments